Cart (Loading....) | Create Account
Close category search window
 

Models of test selection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Bhandari, I. ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA ; Simon, H.A. ; Siewiorek, D.P.

Complex systems such as computers, aerospace systems, etc., are often tested by using a sequence of tests to exercise the functionality of the system. If the system fails a test, an error message is generated, initiating the test selection (TS) phase. The troubleshooter must decide whether or not to run more tests. Should the troubleshooter decide to conduct more tests, a test must be chosen as it may no longer be useful to conform to the predefined sequence. While in the TS phase, the troubleshooter will repeatedly make these decisions until he is done. The authors present a domain-independent framework to automate TS that is based on two computational models, TI and TP. Both models are needed for the authors show there are applications for which one model performs well, while the other model performs poorly. The use of the appropriate model for automating TS is indicated by certain characteristics of the testing sequence and the system under test

Published in:

Systems, Man and Cybernetics, IEEE Transactions on  (Volume:25 ,  Issue: 10 )

Date of Publication:

Oct 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.