By Topic

A New Low Loss Rotman Lens Design for Multibeam Phased Arrays

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Schulwitz, L. ; Dept. of Electr. Eng., Michigan Univ., Ann Arbor, MI ; Mortazawi, Amir

The design methodology and analysis of a new low loss Rotman lens beam-forming network is presented. With the introduction of dielectric contours of varying permittivity within the lens, enhanced focusing is achieved. The varying permittivity is realized through a synthesized dielectric technique, where a periodic lattice of holes is formed within the dielectric substrate. In comparison to a conventional Rotman lens of similar shape and size, this new enhanced focused Rotman lens shows an insertion loss improvement of 1.2 to 2.0 dB. Also, the decrease in gain at the extreme scan angles is reduced from 1.5dB to 0.7dB

Published in:

Microwave Symposium Digest, 2006. IEEE MTT-S International

Date of Conference:

11-16 June 2006