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Generation of deterministic test patterns by minimal basic test sets

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1 Author(s)
Kunzmann, A.B. ; Forschungszentrum Inf., Karlsruhe, Germany

The author presents a new strategy to select a minimal test pattern set as a basis for test pattern generation by specific software or hardware modules. In contrast to other proposals this procedure is totally independent of the used test pattern generation algorithm. Based on the basic deterministic test pattern set, the test generation hardware can be easily realized. It is possible to show that the storage requirements could be drastically reduced on an average of more than 80% compared with the original deterministic test pattern sets

Published in:

Design Automation Conference, 1992., EURO-VHDL '92, EURO-DAC '92. European

Date of Conference:

7-10 Sep 1992

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