By Topic

Automatic eyeglasses removal from face images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Chenyu Wu ; Robotics Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Ce Liu ; Heung-Yueng Shum ; Ying-Qing Xy
more authors

In this paper, we present an intelligent image editing and face synthesis system that automatically removes eyeglasses from an input frontal face image. Although conventional image editing tools can be used to remove eyeglasses by pixel-level editing, filling in the deleted eyeglasses region with the right content is a difficult problem. Our approach works at the object level where the eyeglasses are automatically located, removed as one piece, and the void region filled. Our system consists of three parts: eyeglasses detection, eyeglasses localization, and eyeglasses removal. First, an eye region detector, trained offline, is used to approximately locate the region of eyes, thus the region of eyeglasses. A Markov-chain Monte Carlo method is then used to accurately locate key points on the eyeglasses frame by searching for the global optimum of the posterior. Subsequently, a novel sample-based approach is used to synthesize the face image without the eyeglasses. Specifically, we adopt a statistical analysis and synthesis approach to learn the mapping between pairs of face images with and without eyeglasses from a database. Extensive experiments demonstrate that our system effectively removes eyeglasses.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:26 ,  Issue: 3 )