Cart (Loading....) | Create Account
Close category search window
 

Edge chain analysis for object verification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Cowan, C. ; SRI International, Menlo Park, CA ; Bolles, R. ; Hannah, M. ; Herson, J.

A technique for verifying an object hypothesis by comparing hypothesized edge patterns to detected edge patterns is presented. Positive evidence for a hypothesis is identified as those portions of the model edges that are found in the image, either as geometrical features (such as straight lines or circular arcs} or as linked edges of arbitrary shape. Occluded portions of a model edge are detected by analyzing junctions of image and model edge chains. Negative evidence is identified as those portions of the model edges that are not found and are not occluded. We describe the types of junctions that can occur between image and model edges and discuss a technique for identifying occluded regions based on these junctions. Preliminary results of these techniques are also presented.

Published in:

Robotics and Automation. Proceedings. 1986 IEEE International Conference on  (Volume:3 )

Date of Conference:

Apr 1986

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.