Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

An Efficient Scene Detection Using Rough Set-Based Fuzzy Clustering for Film Video
Xianzhong Zhou   Yaqin Zhao   Jianyu Wang  
Sch. of Manage. & Eng., Nanjing Univ.;

This paper appears in: Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
Publication Date: 0-0 0
Volume: 2,  On page(s): 10435-10439
Location: Dalian,
ISBN: 1-4244-0332-4
INSPEC Accession Number: 9055793
Digital Object Identifier: 10.1109/WCICA.2006.1714048
Current Version Published: 2006-10-23

Abstract
It is important to organize the unstructured video data properly for content-based video analysis and retrieval. In this paper, an efficient film video scene detection method is presented by using a rough set-based shot fuzzy clustering algorithm for film. Equivalence relation theory is applied to group video shots into clusters. Initial shot clustering is performed directly by judging whether equivalence relations are equal, not computing the intersection of equivalence classes as usual. And excessive generation of some small classes is suppressed by secondary clustering on the basis of defining fuzzy similarity between two initial clusters. Afterwards, according to the characterization of film video scene, three types of temporal relationships between two shot clusters are introduced. We introduce a temporally and spatially integrated strategy for parsing shot clusters into semantic scenes. The scheme offers an efficient mean for browsing and effectively retrieving film video

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (324 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved