Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Robust filtering for discrete-time systems with bounded noise andparametric uncertainty
El Ghaoui, L.   Calafiore, G.  
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA;

This paper appears in: Automatic Control, IEEE Transactions on
Publication Date: Jul 2001
Volume: 46,  Issue: 7
On page(s): 1084-1089
ISSN: 0018-9286
References Cited: 28
CODEN: IETAA9
INSPEC Accession Number: 6994784
Digital Object Identifier: 10.1109/9.935060
Current Version Published: 2002-08-07

Abstract
This note presents a new approach to finite-horizon guaranteed state prediction for discrete-time systems affected by bounded noise and unknown-but-bounded parameter uncertainty. Our framework handles possibly nonlinear dependence of the state-space matrices on the uncertain parameters. The main result is that a minimal confidence ellipsoid for the state, consistent with the measured output and the uncertainty description, may be recursively computed in polynomial time, using interior-point methods for convex optimization. With n states, l uncertain parameters appearing linearly in the state-space matrices, with rank-one matrix coefficients, the worst-case complexity grows as O(l(n + l)3.5) With unstructured uncertainty in all system matrices, the worst-case complexity reduces to O(n3.5)

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (236 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved