Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Error-bound for the non-exact SVD-based complexity reduction of thegeneralized type hybrid neural networks with non-singleton consequents
Takacs, O.   Varkonyi-Koczy, A.R.  
Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ.;

This paper appears in: Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Publication Date: 2001
Volume: 3,  On page(s): 1607-1612 vol.3
Meeting Date: 05/21/2001 - 05/23/2001
Location: Budapest, Hungary
ISBN: 0-7803-6646-8
References Cited: 14
INSPEC Accession Number: 7080975
Digital Object Identifier: 10.1109/IMTC.2001.929475
Current Version Published: 2002-08-07

Abstract
The main advantage of neural networks (NNs) is that they are able to solve complicated problems, even if the exact mathematical model is not known. However, there is no universal method for the approximation of the proper size of the neural networks which usually results in the overestimation of the needed size. Therefore, the need arises to have formal methods for the complexity reduction of neural networks. Singular Value Decomposition (SVD) based complexity reduction was first proposed for various fuzzy inference systems. Recently, the method has been extended to generalized neural network, which made possible the use of neural networks in time-critical systems. Beyond the elimination of redundancy, the SVD-based reduction can be used to achieve further reduction, if a certain amount of error can be tolerated. This paper gives an error-bound for this further complexity reduction of generalized type hybrid neural networks with non-singleton consequents

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (388 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved