Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

HTS SQUID microscope head with sharp permalloy rod for high spatialresolution
Nagaishi, T.   Minamimura, K.   Itozaki, H.  
Sumitomo Electr. Hightechs, Hyogo;

This paper appears in: Applied Superconductivity, IEEE Transactions on
Publication Date: Mar 2001
Volume: 11,  Issue: 1, Part 1
On page(s): 226-229
Meeting Date: 09/17/2000 - 09/22/2000
Location: Virginia Beach, VA, USA
ISSN: 1051-8223
References Cited: 6
CODEN: ITASE9
INSPEC Accession Number: 6937175
Digital Object Identifier: 10.1109/77.919325
Current Version Published: 2002-08-07

Abstract
Spatial resolution with a sharp permalloy rod on an HTS SQUID microscope head was investigated. A 5 mm diameter and 10 mm long permalloy rod with one side sharp and one side flat is placed In front of a washer type SQUID with 0.1 mm spacing. A 0.3 mm line and space meander line on a printed circuit board carrying current was used as a magnetic field source. The SQUID microscope head with the sharp permalloy rod scanned two dimensionally on the meander line inside the magnetic shield. The 0.3 mm line and space meander line was resolved. We also demonstrated imaging of laser-printed characters. This method has the advantage of using a washer type SQUID with high magnetic sensitivity, high spatial resolution and facilitating the adjustment of the position and the measurement distance from the sample

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (360 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved