Automating test case generation for the new generation missionsoftware system
Yu-Wen Tung
Aldiwan, W.S.
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA;
This paper appears in: Aerospace Conference Proceedings, 2000 IEEE
Publication Date: 2000
Volume: 1,
On page(s): 431-437 vol.1
Meeting Date: 03/18/2000 - 03/25/2000
Location: Big Sky, MT, USA
ISBN: 0-7803-5846-5
References Cited: 9
INSPEC Accession Number: 6763021
Digital Object Identifier: 10.1109/AERO.2000.879426
Current Version Published: 2002-08-06
Abstract
The significant expansion of autonomous control and information
processing capabilities in the coming generation of mission software
systems results in a qualitatively larger space of behaviors that needs
to be “covered” during testing, not only at the system level
but also at subsystem and unit levels. A major challenge in this area is
to automatically generate a relatively small set of test cases that,
collectively, guarantees a selected degree of coverage of the behavior
space. This paper describes an algorithm for a parametric test case
generation tool that applies a combinatorial design approach to the
selection of candidate test cases. Evaluation of this algorithm on test
parameters from the Deep Space One mission reveals a valuable reduction
in the number of test cases, when compared to an earlier home-brewed
generator
Index
Terms
Available to subscribers and IEEE members.
References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
Cart
