Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Constellation: a visualization tool for linguistic queries fromMindNet
Munzner, T.   Guimbretiere, F.   Robertson, G.  
Stanford Univ., CA;

This paper appears in: Information Visualization, 1999. (Info Vis '99) Proceedings. 1999 IEEE Symposium on
Publication Date: 1999
On page(s): 132-135, 154
Meeting Date: 10/24/1999 - 10/29/1999
Location: San Francisco, CA, USA
ISBN: 0-7695-0431-0
References Cited: 14
INSPEC Accession Number: 6423215
Digital Object Identifier: 10.1109/INFVIS.1999.801869
Current Version Published: 2002-08-06

Abstract
Constellation is a visualization system for the results of queries from the MindNet natural language semantic network. Constellation is targeted at helping MindNet's creators and users refine their algorithms, as opposed to understanding the structure of language. We designed a special-purpose graph layout algorithm which exploits higher-level structure in addition to the basic node and edge connectivity. Our layout prioritizes the creation of a semantic space to encode plausibility instead of traditional graph drawing metrics like minimizing edge crossings. We make careful use of several perceptual channels both to minimize the visual impact of edge crossings and to emphasize highlighted constellations of nodes and edges

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (104 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved