Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Sir J.C. Bose revisited [MM wave research]
Sarkar, T.K.  
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., NY;

This paper appears in: TENCON '98. 1998 IEEE Region 10 International Conference on Global Connectivity in Energy, Computer, Communication and Control
Publication Date: 1998
Volume: 2,  On page(s): 291-294 vol.2
Meeting Date: 12/17/1998 - 12/19/1998
Location: New Delhi, India
ISBN: 0-7803-4886-9
References Cited: 17
INSPEC Accession Number: 6468365
Digital Object Identifier: 10.1109/TENCON.1998.798146
Current Version Published: 2002-08-06

Abstract
The presentation of the work of Sir. J.C. Bose (1895, 1896, 1897, 1927) to the scientific community has resulted in a plethora of newspaper articles which claimed that perhaps the western scientific world of Lords Rayleigh and Kelvin which created Bose, attempted to deprive him of his Noble Prize for his work on electromagnetic phenomena which were carried out at the same time as that of Marconi. In view of this, it is perhaps worthwhile to take a critical look at Sir J.C. Boses's work on millimeter waves and appraise what the contemporary scientists thought about it. During such a review, we found many interesting issues which are the subject of this paper. There is no question that the scientific community embraced Bose as a great experimentalist. Creating accurate apparatus was his forte. However, there appears to be some serious questions lingering on his scientific work which was communicated to him by Lord Rayleigh and Sir William Crooks. The objective of this article is to review that situation

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (340 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved