Single view metrology
Criminisi, A.
Reid, I.
Zisserman, A.
Dept. of Eng. Sci., Oxford Univ.;
This paper appears in: Computer Vision, 1999. The Proceedings of the Seventh IEEE International Conference on
Publication Date: 1999
Volume: 1,
On page(s): 434-441 vol.1
Meeting Date: 09/20/1999 - 09/27/1999
Location: Kerkyra, Greece
ISBN: 0-7695-0164-8
References Cited: 16
INSPEC Accession Number: 6365242
Digital Object Identifier: 10.1109/ICCV.1999.791253
Current Version Published: 2002-08-06
Abstract
We describe how 3D affine measurements may be computed from a
single perspective view of a scene given only minimal geometric
information determined from the image. This minimal information is
typically the vanishing line of a reference plane and a vanishing point
for a direction not parallel to the plane. It is shown that affine scene
structure may then be determined from the image, without knowledge of
the camera's internal calibration (e.g. focal length), nor of the
explicit relation between camera and world (pose). In particular we show
how to: compute the distance between planes parallel to the reference
plane (up to a common scale factor); compute area and length ratios on
any plane parallel to the reference plane; determine the camera's
(viewer's) location. Simple geometric derivations are given for these
results. We also develop an algebraic representation which unifies the
three types of measurement and, amongst other advantages, permits a
first order error propagation analysis to be performed, associating an
uncertainty with each measurement. We demonstrate the technique for a
variety of applications, including height measurements in forensic
images and 3D graphical modelling from single images
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