Measurement of the absolute penetration depth and surfaceresistance of superconductors using the variable spacing parallel plateresonator
Talanov, V.V.
Mercaldo, L.V.
Anlage, S.M.
Dept. of Phys., Maryland Univ., College Park, MD ;
This paper appears in: Applied Superconductivity, IEEE Transactions on
Publication Date: Jun 1999
Volume: 9,
Issue: 2, Part 2
On page(s): 2179-2182
Meeting Date: 09/13/1998 - 09/18/1998
Location: Palm Desert, CA, USA
ISSN: 1051-8223
References Cited: 15
CODEN: ITASE9
INSPEC Accession Number: 6362749
Digital Object Identifier: 10.1109/77.784900
Current Version Published: 2002-08-06
Abstract
We have developed a modified Parallel Plate Transmission Line
Resonator with a smoothly variable thickness of the dielectric spacer
filled by liquid nitrogen. A cryogenic linear stage is made to vary the
spacer from 200 μm down to contact with 0.1 μm resolution.
Estimates of the absolute penetration depth and the surface resistance
are based on the analysis of the spacer thickness dependencies of the
resonator frequency and Q-factor. The measurements are performed at
fixed temperature (77 K), so the result does not depend on an a priori
model for the temperature dependence of the penetration depth. The
ability of this technique to be employed as a standard for
characterization of HTS films for microwave applications is pointed out
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