Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

An asymptotic property of model selection criteria
Yuhong Yang   Barron, A.R.  
Dept. of Stat., Iowa State Univ., Ames, IA;

This paper appears in: Information Theory, IEEE Transactions on
Publication Date: Jan 1998
Volume: 44,  Issue: 1
On page(s): 95-116
ISSN: 0018-9448
References Cited: 48
CODEN: IETTAW
INSPEC Accession Number: 5812007
Digital Object Identifier: 10.1109/18.650993
Current Version Published: 2002-08-06

Abstract
Probability models are estimated by use of penalized log-likelihood criteria related to Akaike (1973) information criterion (AIC) and minimum description length (MDL). The accuracies of the density estimators are shown to be related to the tradeoff between three terms: the accuracy of approximation, the model dimension, and the descriptive complexity of the model classes. The asymptotic risk is determined under conditions on the penalty term, and is shown to be minimax optimal for some cases. As an application, we show that the optimal rate of convergence is simultaneously achieved for log-densities in Sobolev spaces W2s(U) without knowing the smoothness parameter s and norm parameter U in advance. Applications to neural network models and sparse density function estimation are also provided

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1260 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved