Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Fault injection for the masses
Voas, J.  
Reliable Software Technol., USA;

This paper appears in: Computer
Publication Date: Dec 1997
Volume: 30,  Issue: 12
On page(s): 129-130
ISSN: 0018-9162
References Cited: 0
CODEN: CPTRB4
INSPEC Accession Number: 5788817
Digital Object Identifier: 10.1109/2.642820
Current Version Published: 2002-08-06

Abstract
The key technology that the author would like to see adopted by the masses is a family of software fault injection algorithms that can predict where to concentrate testing. From a novelty standpoint, these algorithms were (and still are) unique among other methods of performing fault injection. The author concedes that the algorithms are computational, but the results can provide unequaled information about how “bad things” propagate through systems. Because of that, he thinks fault injection methods are valuable to anyone responsible for software quality, including those working in one-person independent software vendors (ISVs) or even the largest corporations

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (276 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved