Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Size effects in barium titanate thin film heterostructures withconductive oxide electrodes
Maria, J.-P.   Trolier-McKinstry, S.   Schlom, D.G.  
Pennsylvania State Univ., University Park, PA;

This paper appears in: Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
Publication Date: 18-21 Aug 1996
Volume: 1,  On page(s): 333-336 vol.1
Meeting Date: 08/18/1996 - 08/21/1996
Location: East Brunswick, NJ, USA
ISBN: 0-7803-3355-1
References Cited: 9
INSPEC Accession Number: 5723529
Digital Object Identifier: 10.1109/ISAF.1996.602761
Current Version Published: 2002-08-06

Abstract
Thin film, small particle, and fine grained materials have long been known to behave differently from their bulk counterparts, and as such, these differences have been termed size effects. The origins of size effects, though well known for some materials, in ferroelectrics are largely misunderstood. Currently inhibiting the application of ferroelectrics, these effects become commercially important in devices such as MEMs, MLCs and DRAMs. Included in such structures are ferroelectric layers with thicknesses or grains approaching the critical size below which ferroelectric properties degrade. Expitaxial BaTiO3 thin film heterostructures utilizing conductive oxide electrodes have been deposited by PLD, while 4-circle X-ray diffraction, electrical property measurements, and RBS have been applied to characterize the films. The Curie temperatures for BaTiO3 films were found to be depressed by as much as 150°C, with the magnitude of this depression believed to be dependent upon the coherent crystal size of the films

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (332 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved