Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Continuous signature monitoring: low-cost concurrent detection ofprocessor control errors
Wilken, K.   Shen, J.P.  
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA;

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: Jun 1990
Volume: 9,  Issue: 6
On page(s): 629-641
Meeting Date: 09/12/1988 - 09/14/1988
Location: Washington, DC, USA
ISSN: 0278-0070
References Cited: 36
CODEN: ITCSDI
INSPEC Accession Number: 3721465
Digital Object Identifier: 10.1109/43.55193
Current Version Published: 2002-08-06

Abstract
A low-cost approach to concurrent detection of processor control errors is presented that uses a simple hardware monitor and signatures embedded into the executing program. Existing signature-monitoring techniques detect a large portion of processor control errors at a fraction of the cost of duplication. Analytical methods developed in this study show that the new approach, continuous signature monitoring (CSM), makes major advances beyond existing techniques. CSM reduces the fraction of undetected control-flow errors by orders of magnitude, to less than 10-6, while the number of signatures reaches a theoretical minimum, being lowered by as much as three times to a range of 4-11%. Signature cost is reduced by placing CSM signatures at locations that minimize performance loss and (for some architectures) memory overhead. CSM exploits the program memory's SEC/DED code to decrease error-detection latency by as much as 1000 times, to 0.016 program memory cycles, without increasing memory overhead. This short latency allows transient faults to be tolerated

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1296 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved