Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Automation of IC layout with analog constraints
Malavasi, E.   Charbon, E.   Felt, E.   Sangiovanni-Vincentelli, A.  
Cadence Design Syst. Inc., San Jose, CA;

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: Aug 1996
Volume: 15,  Issue: 8
On page(s): 923-942
ISSN: 0278-0070
References Cited: 52
CODEN: ITCSDI
INSPEC Accession Number: 5348494
Digital Object Identifier: 10.1109/43.511572
Current Version Published: 2002-08-06

Abstract
A methodology for the automatic synthesis of full-custom IC layout with analog constraints is presented. The methodology guarantees that all performance constraints are met when feasible, or otherwise, infeasibility is detected as soon as possible, thus providing a robust and efficient design environment. In the proposed approach, performance specifications are translated into lower-level bounds on parasitics or geometric parameters, using sensitivity analysis. Bounds can be used by a set of specialized layout tools performing stack generation, placement, routing, and compaction. For each tool, a detailed description is provided of its functionality, of the way constraints are mapped and enforced, and of its impact on the design flow. Examples drawn from industrial applications are reported to illustrate the effectiveness of the approach

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (2516 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved