Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

The role of the drain wire in modern foil cable shields
Hoeft, L.O.   Estes, J.C.  
BDM Int., Inc., Albuquerque, NM;

This paper appears in: Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on
Publication Date: 9-13 Aug 1993
On page(s): 16-19
Meeting Date: 08/09/1993 - 08/13/1993
Location: Dallas, TX, USA
ISBN: 0-7803-1304-6
References Cited: 4
INSPEC Accession Number: 4991599
Digital Object Identifier: 10.1109/ISEMC.1993.473789
Current Version Published: 2002-08-06

Abstract
Theoretical and experimental analysis of a wide range of shields that combine an electrically thin cylindrical shield with a drain wire/current diverter shows that the surface transfer impedance can be characterized as a solid foil shield in parallel with the impedance of the drain wire. The drain wire/current diverter should be modeled as an inductor and a frequency-dependent resistor in series. The resistance is frequency-dependent because of skin depth effects. Neglecting high-frequency aperture coupling, the surface transfer impedance of a foil shield with drain wire can be characterized in three frequency regimes. At low frequencies, the transfer impedance is determined by the resistance of the drain wire. At intermediate frequencies, the resistance of the drain wire increases due to skin depth and inductive effects. For most cable shields, the skin depth effect will dominate. At higher frequencies, for cable samples that use good (circumferential) shield termination techniques, the surface transfer impedance is determined by the transfer impedance of the foil shield

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (352 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved