Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Penalized maximum-likelihood image reconstruction usingspace-alternating generalized EM algorithms
Fessler, J.A.   Hero, A.O., III  
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI;

This paper appears in: Image Processing, IEEE Transactions on
Publication Date: Oct 1995
Volume: 4,  Issue: 10
On page(s): 1417-1429
ISSN: 1057-7149
References Cited: 53
CODEN: IIPRE4
INSPEC Accession Number: 5091847
Digital Object Identifier: 10.1109/83.465106
Current Version Published: 2002-08-06

Abstract
Most expectation-maximization (EM) type algorithms for penalized maximum-likelihood image reconstruction converge slowly, particularly when one incorporates additive background effects such as scatter, random coincidences, dark current, or cosmic radiation. In addition, regularizing smoothness penalties (or priors) introduce parameter coupling, rendering intractable the M-steps of most EM-type algorithms. This paper presents space-alternating generalized EM (SAGE) algorithms for image reconstruction, which update the parameters sequentially using a sequence of small “hidden” data spaces, rather than simultaneously using one large complete-data space. The sequential update decouples the M-step, so the maximization can typically be performed analytically. We introduce new hidden-data spaces that are less informative than the conventional complete-data space for Poisson data and that yield significant improvements in convergence rate. This acceleration is due to statistical considerations, not numerical overrelaxation methods, so monotonic increases in the objective function are guaranteed. We provide a general global convergence proof for SAGE methods with nonnegativity constraints

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1228 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved