Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Static Deadlock Detection for the SHIM Concurrent Language
Vasudevan, N.   Edwards, S.A.  
Dept. of Comput. Sci., Columbia Univ., New York, NY;

This paper appears in: Formal Methods and Models for Co-Design, 2008. MEMOCODE 2008. 6th ACM/IEEE International Conference on
Publication Date: 5-7 June 2008
On page(s): 49-58
Location: Anaheim, CA,
ISBN: 978-1-4244-2417-7
INSPEC Accession Number: 10072626
Digital Object Identifier: 10.1109/MEMCOD.2008.4547686
Current Version Published: 2008-06-20

Abstract
Concurrent programming languages are becoming mandatory with the advent of multi-core processors. Two major concerns in any concurrent program are data races and deadlocks. Each are potentially subtle bugs that can be caused by non-deterministic scheduling choices in most concurrent formalisms. As an alternative, the SHIM concurrent language guarantees the absence of data races by eschewing shared memory, but a SHIM program may still deadlock if a program violates a communication protocol. We present a model-checking-based static deadlock detection technique for the SHIM language. Although SHIM is asynchronous, its semantics allow us to model it synchronously without losing precision, greatly reducing the state space that must be explored. This plus the obvious division between control and data in SHIM programs makes it easy to construct concise abstractions. Experimentally, we find our procedure runs in only a few seconds for modest-sized programs, making it practical to use as part of a compilation chain.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (278 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved