Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Exploiting Occluding Contours for Real-Time 3D Tracking: A Unified Approach
Gang Li   Yanghai Tsin   Genc, Y.  
Siemens Corp. Res., Princeton;

This paper appears in: Computer Vision, 2007. ICCV 2007. IEEE 11th International Conference on
Publication Date: 14-21 Oct. 2007
On page(s): 1-8
Location: Rio de Janeiro,
ISSN: 1550-5499
ISBN: 978-1-4244-1631-8
INSPEC Accession Number: 9848997
Digital Object Identifier: 10.1109/ICCV.2007.4408953
Current Version Published: 2007-12-26

Abstract
Model-based 3D object tracking is fast and robust using 3D edges. However, traditional edge-based approaches have difficulty handling occluding contours of curved surfaces, since they are not static model edges but change with the viewpoint. In this paper we propose a unified approach to edge-based tracking where 3D edges including occluding contours are utilized. This is achieved through an analysis of local surface differential geometry, which provides the foundation for incorporating occluding contours of curved surfaces into edge-based tracking. This approach uses a simple parametrization of both types of model edges within the same framework. The proposed method has been tested within the context of an existing edge-based tracking system. The system can track both types of model edges in a very fast and robust manner. Experimental results on both synthetic and real scenes are provided, which confirm that occluding contours improve real-time 3D tracking performance.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (2327 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved