Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Non-Linear Precomputation For Optimal Data sources and Paths Searching
Wang Xiaoqing   Guo Yong   Zheng Yanxing   Shi Meilin  
Tsinghua Univ., Beijing;

This paper appears in: Information Reuse and Integration, 2007. IRI 2007. IEEE International Conference on
Publication Date: 13-15 Aug. 2007
On page(s): 67-72
Location: Las Vegas, IL,
ISBN: 1-4244-1500-4
INSPEC Accession Number: 9824199
Digital Object Identifier: 10.1109/IRI.2007.4296599
Current Version Published: 2007-09-04

Abstract
While data and path redundance avoids, to some extent, data damages and mission failures resulting from node failures in networks, users must face up to the great challenge of Quality of Service(QoS), i.e., how to select optimal data sources and paths among different data sources. We address ourselves to the problem of Multiple Data Sources Selection(MDSS) for data sharing and propose a precomputation algorithm, namely PAMDSS. PAMDSS decomposes MDSS into two sub-problems, and introduces the concept of Pareto optimization which reduces the search space greatly. By means of nonlinear path length based precomputation, PAMDSS achieves good QoS effects. Extensive simulations show the efficiency of our algorithm.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (334 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved