Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Wireless Localization using Time Difference of Arrival in Narrow-Band Multipath Systems
Comsa, C.-R.   Jianghong Luo   Haimovich, A.   Schwartz, S.  
New Jersey Inst. of Technol., Newark;

This paper appears in: Signals, Circuits and Systems, 2007. ISSCS 2007. International Symposium on
Publication Date: 13-14 July 2007
Volume: 2,  On page(s): 1-4
Location: Iasi,
ISBN: 1-4244-0969-1
INSPEC Accession Number: 9832986
Digital Object Identifier: 10.1109/ISSCS.2007.4292764
Current Version Published: 2007-08-20

Abstract
The problem of estimating the location of a source is addressed based on the time difference of arrival (TDoA) of the first multipath component of the signal at different sensors with known locations. A maximum likelihood (ML) approach is adopted, followed by the presentation of some two-steps techniques. The TDoA estimation is carried out using a correlation technique and a super-resolution method - root multiple signal classification (MUSIC). The source is relatively narrowband and it operates over a wireless channel with a dense multipath environment following the COST-207 channel model. The performance of the source location techniques is evaluated in terms of the root mean square error (rMSE) of the transmitter's position for given placements of the sensors. A precision contour-map provides a graphic, two-dimensional representation of the source location accuracy as a function of the source location and the location of the sensors.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1428 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved