Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Visualizing Design Patterns in Their Applications and Compositions
Dong Jing   Yang Sheng   Zhang Kang  
Univ. of Texas at Dallas, Richardson;

This paper appears in: Software Engineering, IEEE Transactions on
Publication Date: July 2007
Volume: 33,  Issue: 7
On page(s): 433-453
Location: San Francisco, CA, USA,
ISSN: 0098-5589
INSPEC Accession Number: 9621355
Digital Object Identifier: 10.1109/TSE.2007.1012
Current Version Published: 2007-06-11

Abstract
Design patterns are generic design solutions that can be applied and composed in different applications where pattern-related information is generally implicit in the Unified Modeling Language (UML) diagrams of the applications. It is unclear in which pattern instances each modeling element, such as class, attribute, and operation, participates. It is hard for a designer to find the design patterns used in an application design. Consequently, the benefits of design patterns are compromised because designers cannot communicate with each other in terms of the design patterns they used and their design decisions and trade-offs. In this paper, we present a UML profile that defines new stereotypes, tagged values, and constraints for tracing design patterns in UML diagrams. These new stereotypes and tagged values are attached to a modeling element to explicitly represent the role the modeling element plays in a design pattern so that the user can identify the pattern in a UML diagram. Based on this profile, we also develop a Web service (tool) for explicitly visualizing design patterns in UML diagrams. With this service, users are able to visualize design patterns in their applications and compositions because pattern-related information can be dynamically displayed. A real-world case study and a comparative experiment with existing approaches are conducted to evaluate our approach.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (7368 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved