Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

PLATO: Predictive Latency-Aware Total Ordering
Balakrishnan, M.   Birman, K.   Phanishayee, A.  
Dept. of Comput. Sci., Cornell Univ., Ithaca, NY;

This paper appears in: Reliable Distributed Systems, 2006. SRDS '06. 25th IEEE Symposium on
Publication Date: 2-4 Oct. 2006
On page(s): 175-188
Location: Leeds,
ISSN: 1060-9857
ISBN: 0-7695-2677-2
INSPEC Accession Number: 9274815
Digital Object Identifier: 10.1109/SRDS.2006.36
Current Version Published: 2006-12-19

Abstract
PLATO is a predictive total ordering protocol designed for low-latency multicast in datacenters. It predicts out-of-order arrival of multicast packets by observing their inter-arrival times, and delays packets before passing them up to the application only if it believes the packets to have arrived in the wrong order. We show through experimentation on real datacenter-style networks that the inter-arrival time of consecutive packet pairs is an excellent predictor of out-of-order delivery. We evaluate an implementation of PLATO on the Emulab testbed, and show that it drives down delivery latencies by more than a factor of 2 compared to the fixed-sequencer protocol

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (747 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved