Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Perspectives on Service-Oriented Computing and Service-Oriented System Engineering
W. T. Tsai   Miroslaw Malek   Yinong Chen   Farokh Bastani  
Arizona State Univ., Tempe, AZ;

This paper appears in: Service-Oriented System Engineering, 2006. SOSE '06. Second IEEE International Workshop
Publication Date: Oct. 2006
On page(s): 3-10
Location: Shanghai,
ISBN: 0-7695-2726-4
INSPEC Accession Number: 9308322
Digital Object Identifier: 10.1109/SOSE.2006.24
Current Version Published: 2006-12-11

Abstract
The service-oriented computing (SOC) paradigm leads the innovation of today's computing system and software development, and it can transform the human society into a new republic of all-to-all connected world. There are a number of interesting and innovative research challenges involved in achieving this vision of service-oriented system engineering (SOSE). This paper highlights some of these significant research opportunities and also the need for enhanced education in this emerging area

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (189 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved