Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Towards a Generalized Stochastic Model of End-to-End Packet-Pair Sampling
Xiliang Liu   Ravindran, K.   Loguinov, D.  
Dept. of Comput. Sci., City Univ. of New York, NY;

This paper appears in: Selected Areas in Communications, IEEE Journal on
Publication Date: Dec. 2006
Volume: 24,  Issue: 12
On page(s): 2249-2262
ISSN: 0733-8716
INSPEC Accession Number: 9202437
Digital Object Identifier: 10.1109/JSAC.2006.884024
Current Version Published: 2006-11-30

Abstract
End-to-end packet-pair probing has been used as one of the primary mechanisms to measure bottleneck capacity, cross-traffic intensity, and available bandwidth of end-to-end Internet paths. However, there has been lacking an understanding of what types of information about the path are sampled by packet-pairs and how they are encoded in the corresponding output dispersions. In this paper, we answer these questions by deriving the expression of individual output spacings (i.e., dispersions) in the context of multihop paths and general bursty cross-traffic arrivals. Based on these results, we examine stochastic properties of the sampled signals and derive the statistical mean of the output interpacket spacings as a recursive function of the input spacing. We show that the result is different from what has been obtained in prior work using fluid cross-traffic models and that this discrepancy has a significant adverse impact on the accuracy of packet-pair bandwidth measurement techniques

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (718 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved