Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Tolerating sensor timing faults in highly responsive hard real-timesystems
Poledna, S.  
Robert Bosch GmbH, Vienna;

This paper appears in: Computers, IEEE Transactions on
Publication Date: Feb 1995
Volume: 44,  Issue: 2
On page(s): 181-191
ISSN: 0018-9340
References Cited: 19
CODEN: ITCOB4
INSPEC Accession Number: 4899532
Digital Object Identifier: 10.1109/12.364530
Current Version Published: 2002-08-06

Abstract
Real-time systems that have to respond to environmental state changes within a very short latency period often use event-triggered task activation. If the system has to function correctly in the presence of sensor faults, event-triggered task activation is not reliable. Faulty sensors may cause task activations to occur too early, too late, or task activations are omitted entirely. In particular, early task activations can overload the system. Time-triggered task activation is reliable, but by defining a competitiveness ratio it is shown that the processor utilization for highly responsive tasks is unacceptably low. To overcome the problems of event-triggered task activation while preserving its good performance the task-splitting model is introduced. The task-splitting model integrates fault tolerance into the analysis and construction of hard real-time systems by using a combination of event-triggered and time-triggered task activation. Based on a general task model, it is independent of any particular scheduling algorithm. The result of this work has influenced the design of a new operating system which will be applied in a robust automotive engine controller of the next generation

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (996 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved