Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Model Order Selection and Cue Combination for Image Segmentation
Rabinovich, A.   Belongie, S.   Lange, T.   Buhmann, J.M.  
University of California, San Diego;

This paper appears in: Computer Vision and Pattern Recognition, 2006 IEEE Computer Society Conference on
Publication Date: 17-22 June 2006
Volume: 1,  On page(s): 1130- 1137
ISSN: 1063-6919
ISBN: 0-7695-2597-0
Digital Object Identifier: 10.1109/CVPR.2006.186
Current Version Published: 2006-07-05

Abstract
Model order selection and cue combination are both difficult open problems in the area of clustering. In this work we build upon stability-based approaches to develop a new method for automatic model order selection and cue combination with applications to visual grouping. Novel features of our approach include the ability to detect multiple stable clusterings (instead of only one), a simpler means of calculating stability that does not require training a classifier, and a new characterization of the space of stabilities for a continuum of segmentations that provides for an efficient sampling scheme. Our contribution is a framework for visual grouping that frees the user from the hassles of parameter tuning and model order selection: the input is an image, the output is a shortlist of segmentations.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (4072 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved