Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Robust Head Tracking Based on a Multi-State Particle Filter
Yuan Li   Haizhou Ai   Chang Huang   Shihong Lao  
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing;

This paper appears in: Automatic Face and Gesture Recognition, 2006. FGR 2006. 7th International Conference on
Publication Date: 2-6 April 2006
On page(s): 335-340
Location: Southampton,
ISBN: 0-7695-2503-2
INSPEC Accession Number: 9073206
Digital Object Identifier: 10.1109/FGR.2006.96
Current Version Published: 2006-04-24

Abstract
This paper proposes a novel method for robust and automatic realtime head tracking by fusing face and head cues within a multi-state particle filter. Due to large appearance variability of human head, most existing head tracking methods use little object-specific prior knowledge, resulting in limited discriminant power. In contrast, face is a distinct pattern much easier to capture, which motivates us to incorporate a vector-boosted multi-view face detector (C. Huang, et al., 2005) to lend strong aid to general head observation cues including color and contour edge. To simultaneously and collaboratively perform temporal inference of both the face state and the head state, a Markov-network-based particle filter is constructed using sequential belief propagation Monte Carlo (G. Hua, et al., 2004). Our approach is tested on sequences used by previous researchers as well as on new data sets which includes many challenging real-world cases, and shows robustness against various unfavorable conditions

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (512 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved