Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Control to facet problems for affine systems on simplices and polytopes – With applications to control of hybrid systems
Habets, L.C.G.J.M.   van Schuppen, J.H.  
Department of Mathematics and Computer Science, Technische Universiteit Eindhoven, P.O. Box 513, NL -5600 MB Eindhoven, The Netherlands, and CWI - Centrum voor Wiskunde en Informatica, P.O. Box 94079, NL -1090 GB Amsterdam, The Netherlands. E-mail: l.c.g.j.m.habets@tue.nl;

This paper appears in: Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
Publication Date: 12-15 Dec. 2005
On page(s): 4175- 4180
ISBN: 0-7803-9567-0
Current Version Published: 2006-01-30

Abstract
In this paper, a general control-to-facet problem for affine systems on polytopes is studied: find an affine feedback law such that all trajectories of the closed-loop system leave the state polytope through an a priori specified (possibly empty) set of facets. Solutions are presented in terms of (bi)linear inequalities in the coefficients of the affine feedback. The result is applied to control synthesis for piecewise-affine hybrid systems. Using a backward recursion algorithm, a sufficient condition for reachability of hybrid systems is obtained, and a piecewise-affine controller is computed that realizes the required reachability property.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (184 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved