Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Quilt Snaps: a fabric based computational construction kit
Buechley, L.   Elumeze, N.   Dodson, C.   Eisenberg, M.  
Dept. of Comput. Sci., Colorado Univ., Boulder, CO, USA;

This paper appears in: Wireless and Mobile Technologies in Education, 2005. WMTE 2005. IEEE International Workshop on
Publication Date: 28-30 Nov. 2005
On page(s): 3 pp.-
ISBN: 0-7695-2385-4
INSPEC Accession Number: 9071612
Digital Object Identifier: 10.1109/WMTE.2005.55
Current Version Published: 2006-01-23

Abstract
In this paper we present Quilt Snaps, a fabric based construction kit consisting of a set of computationally enhanced quilting pieces. Our discussion focuses on three ways that children can engage with Quilt Snaps. First, Quilt Snaps allows children to act as the engineers, designers, and decorators of their own digital manipulatives. Second, by playing with the manipulatives that they've helped to construct, children can learn about concepts relevant to programming, graph theory, and dynamical systems. Finally, since Quilt Snaps is fabric based, children can use the pieces they construct as personal mobile display media.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (192 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved