Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Shortest paths in stochastic networks
Lloyd-Smith, B.   Kist, A.A.   Harris, R.J.   Shrestha, N.  
Sch. of Comput. Sci. & Inf. Technol., RMIT Univ., Melbourne, Vic., Australia;

This paper appears in: Networks, 2004. (ICON 2004). Proceedings. 12th IEEE International Conference on
Publication Date: 16-19 Nov. 2004
Volume: 2,  On page(s): 492- 496 vol.2
ISSN: 1531-2216
ISBN: 0-7803-8783-X
INSPEC Accession Number: 8348406
Digital Object Identifier: 10.1109/ICON.2004.1409216
Current Version Published: 2005-04-04

Abstract
This paper discusses the sensitivity of network flows to uncertain link state information for various routing protocols. We show that the choice of probability distribution for the link metrics for a given network can have markedly different effects on the probabilities of path selection. Exact results are obtained for these probabilities but their computation is NP-hard. We provide simulation results for three networks to illustrate the sensitivity of shortest paths to different link metric distributions. We provide results for mean path costs and the k-shortest path algorithm as a comparison.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (640 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved