Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Automatic characterization of events on SpO2 signal : comparison of two methods
Chambrin, M.C.   Charbonnier, S.   Sharshar, S.   Becq, G.   Badji, L.  
E.A. 2689, Inserm I.F.R. 114, C.H.U.ofLille, 59037 Lille, France;

This paper appears in: Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Publication Date: 1-5 Sept. 2004
Volume: 2,  On page(s): 3474- 3477
ISBN: 0-7803-8439-3
Current Version Published: 2005-03-14

Abstract
Two methods based on trend extraction have been designed to provide automatic analysis of physiological data recorded on adult patients hospitalized in intensive care unit. We focused our work on the characterization of events occurring on SpO2 signal, this signal being used to detect vital problems. Our aim was to recognize events related to technical or vital problems to assist medical staff in his decision process. Our results show that both methods are able to detect and distinguish between probe deconnection, transient hypoxia and desaturation events.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (2072 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved