Robust system design with built-in soft-error resilience
Mitra, S.
Seifert, N.
Zhang, M.
Shi, Q.
Kim, K.S.
Intel;
This paper appears in: Computer
Publication Date: Feb. 2005
Volume: 38,
Issue: 2
On page(s): 43- 52
ISSN: 0018-9162
INSPEC Accession Number: 8339349
Digital Object Identifier: 10.1109/MC.2005.70
Current Version Published: 2005-03-07
Abstract
Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.
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