Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Using introspection and prototype driven to achieve design analysis in the process of concept generation based on information processing
Wang, Z.   Zhang, D.H.   He, W.P.  
Coll. of Mechanical & Electron. Eng., Northwestern Polytech Univ., Xi'an, China;

This paper appears in: Systems, Man and Cybernetics, 2004 IEEE International Conference on
Publication Date: 10-13 Oct. 2004
Volume: 5,  On page(s): 4348- 4353 vol.5
ISSN: 1062-922X
ISBN: 0-7803-8566-7
INSPEC Accession Number: 8292641
Digital Object Identifier: 10.1109/ICSMC.2004.1401215
Current Version Published: 2005-03-07

Abstract
The research of human's information processing of design thinking show a key role in many fields such as intelligent design, intelligent manufacturing system and next generation CAD system. In order to form a formalization description and disclose the process of conceptual generation under the interaction of designer and computer environment, This work aims to achieve design analysis for early concept generation and present one improved model integrated cognition and computation to construct one robust process model. In order to meet common sense in designing, introspection and prototype driven should be applied to achieve design analysis in the process of concept generation. And generational variable index of product concept is extracted based on the demands of information processing.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (733 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved