Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Knowledge Management Capability Assessment: Validating a Knowledge Assets Measurement Instrument
Freeze, R.   Kulkarni, U.  
Arizona State University;

This paper appears in: System Sciences, 2005. HICSS '05. Proceedings of the 38th Annual Hawaii International Conference on
Publication Date: 03-06 Jan. 2005
On page(s): 251a- 251a
ISSN: 1530-1605
ISBN: 0-7695-2268-8
Digital Object Identifier: 10.1109/HICSS.2005.375
Current Version Published: 2005-01-24

Abstract
Measurement of organizational knowledge assets is necessary to determine the effectiveness of knowledge management initiatives. A Knowledge Management Capability Assessment instrument has been developed and operationalized to measure knowledge assets identified as Knowledge Capability Areas. A longitudinal field study is initiated in a large microchip manufacturing company to determine the reliability and validity of the KMCA and to assess the success of KM initiatives. In this paper, we provide the initial validation of the KMCA with empirical evidence from two business units of the company. Confirmatory factor analysis revealed that four Knowledge Capability Areas can be conceptualized in terms of latent descriptor variables. Each capability area is identified as an overall latent factor influencing a set of latent descriptor variables. Second Order and General-Specific structural equation models of each capability area provide evidence of the validity of measurement of these knowledge assets.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (176 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved