Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

FCM BP based parameter clustering method in speech recognition
Xiang-Hua Xu   Jie Zhu   Qiang Guo  
Dept. of Electron. Eng., Shanghai Jiaotong Univ., China;

This paper appears in: Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Publication Date: 26-29 Aug. 2004
Volume: 6,  On page(s): 3717- 3720 vol.6
ISSN:
ISBN: 0-7803-8403-2
INSPEC Accession Number: 8254340
Current Version Published: 2005-01-24

Abstract
To efficiently decrease the parameter size and improve the robustness of parameter training, a parameter clustering method based on FCM BP fuzzy clustering analysis is proposed. Based on the structure of phonetic decision tree in state tying, leaf nodes are used for Gaussian clustering and root node or temporary parent nodes are used for covariance sharing. The experimental results show when the number of Gaussians is reduced by 50%, the recognition rate only decreases by 0.55%. By combining covariance sharing, a total of 4.16% recognition increasing is achieved over the conventional system with approximately the same parameter size.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (598 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved