Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Caption location and extraction in digital video based on SVM
Zhi-Guo Cheng   Yun-Cai Liu  
Inst. of Image Process. & Pattern Recognition, Shanghai Jiao Tong Univ., China;

This paper appears in: Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Publication Date: 26-29 Aug. 2004
Volume: 6,  On page(s): 3515- 3519 vol.6
ISSN:
ISBN: 0-7803-8403-2
INSPEC Accession Number: 8244884
Current Version Published: 2005-01-24

Abstract
Text that appears in a scene or graphically added to video can provide an important supplemental source of index information as well as clues for decoding the video's structure and for classification, and we call them closed caption. In this work, a novel algorithm is presented for detecting and locating caption in digital video. The first module of the system divides an image into small blocks featured by pixel value that is fed to SVM (support vector machine) to classify whether they are text blocks or not. The other module is to do post-processing on the classified text blocks to identify the rectangle region of them and OCR can be used further and easily. Experiments conducted with a variety of video sources show that our method could detect and locate caption region successfully by SVM with comparatively less samples.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (678 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved