Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Application research of information fusion technology of multi-sensor in level measurement
Zhe-Ying Song   Chao-Ying Liu   Xue-Ling Song  
Coll. of Electr. Eng. & Inf. Sci., Hebei Univ. of Sci. & Technol., China;

This paper appears in: Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Publication Date: 26-29 Aug. 2004
Volume: 6,  On page(s): 3511- 3514 vol.6
ISSN:
ISBN: 0-7803-8403-2
INSPEC Accession Number: 8244883
Current Version Published: 2005-01-24

Abstract
According to the velocity of sound calibration and the nonlinear rectification in the ultrasonic level meter, a new information fusion algorithm based on neural network is presented. An improved BP algorithm -LM algorithm is used to train the neural network, which can improve the data's convergent speed. The simulation result shows that the effect of the temperature to the sound velocity would be fused in the level measurement while realizing non-linear compensation of temperature, so the level can be measured accurately.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (583 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved