Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Dynamically weighted ensemble neural networks for regression problems
Zhang-Quan Shen   Fan-Sheng Kong  
Inst. of Remote Sensing & Inf. Syst. Application, Zhejiang Univ., Hangzhou, China;

This paper appears in: Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Publication Date: 26-29 Aug. 2004
Volume: 6,  On page(s): 3492- 3496 vol.6
ISSN:
ISBN: 0-7803-8403-2
INSPEC Accession Number: 8244881
Current Version Published: 2005-01-24

Abstract
Combining the outputs of several neural networks into an aggregate output often gives improved accuracy over any individual output. The set of networks is known as an ensemble. This work presents an ensemble method for regression that has advantages over simple weighted or weighted average combining techniques. Generally, the output of an ensemble is a weighted sum whose weights are fixed. Our ensemble is weighted dynamically, the weights dynamically determined from the predicting accuracies of the trained networks with training dataset. The more accurate a network seems to be of its prediction, the higher the weight. This is implemented by generalized regression neural network. Empirical results show that this method improved on predicting accuracy.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (670 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved