Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A PID controller with neuron tuning parameters for multi-model plants
Ya-Ping Du   Ning Wang  
Nat. Key Lab. of Ind. Control Technol., Zhejiang Univ., Hangzhou, China;

This paper appears in: Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Publication Date: 26-29 Aug. 2004
Volume: 6,  On page(s): 3408- 3411 vol.6
ISSN:
ISBN: 0-7803-8403-2
INSPEC Accession Number: 8254302
Current Version Published: 2005-01-24

Abstract
Because there exist uncertainties in practice, a real process often presents multi-model dynamic characteristics. Therefore, it is not easy to reach satisfaction performance by using a conventional PID controller. In this paper, the PID control method with neuron tuning parameters is proposed for multi-model plants. In this model-free control system, the PID controller is designed to control a multi-model plant and the adaptive neuron is used to regulate the parameters of the PID controller on line. By self-learning and associative searching, the adaptive neuron can modify the PID controller parameters according to the dynamic characteristics of the plant. Applying the proposed method to the basis weight control of a paper machine, the simulation experiments are made. The results illustrate that the model-free PID controller is available to multi-model plants.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (516 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved