Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Reduction and optimization for a support-vector-machine-based fuzzy-classification-system
Yan-Xin Huang   Yan Wang   Chun-Guang Zhou   Shu-Xue Zou   Xiao-Wei Yang   Yan-Chun Liang  
Coll. of Comput. Sci. & Technol., Jilin Univ., Changchun, China;

This paper appears in: Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Publication Date: 26-29 Aug. 2004
Volume: 6,  On page(s): 3402- 3407 vol.6
ISSN:
ISBN: 0-7803-8403-2
INSPEC Accession Number: 8254301
Current Version Published: 2005-01-24

Abstract
A fuzzy classification system model based on support vector machine is proposed in this paper. Reduction methods are developed to minimize the complexity of the system by reducing the linguistic terms in the fuzzy rules based on the similarity of fuzzy sets, and removing the redundant and inconsistent fuzzy rules. Finally, the particle swarm optimization is used to adjust the system parameters for compensating the deviation caused by the reduction. Experimental results show that the methods are feasible and effective.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (672 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved