Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

ECOC-based structured neural networks
Yan-Huang Jiang   Qiang-Li Zhao   Xue-Jun Yang  
Sch. of Comput. Sci., Nat. Univ. of Defense Technol., Changsha, China;

This paper appears in: Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Publication Date: 26-29 Aug. 2004
Volume: 6,  On page(s): 3389- 3396 vol.6
ISSN:
ISBN: 0-7803-8403-2
INSPEC Accession Number: 8244873
Current Version Published: 2005-01-24

Abstract
The structured neural networks (SNNs) presented by Serpico and Roli have understandable behavior, while they always get lower predictive accuracy than the selected traditional BP neural networks. To improve the generalization of SNN classifiers, this paper proposes ECOC-based structured neural networks (ESNNs) that use error-correcting output codes as the output representation, and adopts the search-coding method to generate ECOCs. For remote-sensing image classification tasks, ESNNs predict pixel classes with relatively high accuracy while keeping the characteristic of understandability.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (813 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved