Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Artificial neural network weights optimization design based on MEC algorithm
Xiao-Juan He   Jun-Chao Zeng   Jing Jie  
Dept. of Math., Taiyuan Heavy Machinery Inst., China;

This paper appears in: Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Publication Date: 26-29 Aug. 2004
Volume: 6,  On page(s): 3361- 3364 vol.6
ISSN:
ISBN: 0-7803-8403-2
INSPEC Accession Number: 8254294
Current Version Published: 2005-01-24

Abstract
Mind evolutionary computation (MEC) is a new approach of evolutionary computation. In this paper, it is adopted to train the weights of artificial neural network (ANN) to solve premature convergence problem of BP algorithm and genetic algorithm. The coding method of taking individual weights as the center of normal distribution is proposed, and information of network weights is used. Dynamic searching method is used, and weights are trained successfully. The simulation result shows that the new method is better than the common BP algorithm and genetic algorithm.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (551 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved