Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Linear and non-linear precoding/decoding for MIMO systems using the fading correlation at the transmitter
Simeone, O.   Spagnolini, U.   Bar-Ness, Y.  
Dipt. di Elettronica e Informazione, Politecnico di Milano, Italy;

This paper appears in: Signal Processing Advances in Wireless Communications, 2003. SPAWC 2003. 4th IEEE Workshop on
Publication Date: 15-18 June 2003
On page(s): 6- 10
ISSN:
ISBN: 0-7803-7858-X
INSPEC Accession Number: 8023275
Current Version Published: 2004-08-09

Abstract
A transceiver structure for MIMO systems that comprises linear/non-linear precoding/decoding is optimized according to the MMSE criterion under the assumption that only long-term channel state information (or LT-CSI, i.e., fading channel and noise correlation matrices) is available at the transmitter. The structure generalizes different techniques known from the literature, such as BLAST, linear precoding and decoding and Tomlinson-Harashima precoding. Performance comparison of these known techniques and the proposed scheme, carried out by means of simulations, shows that relevant benefits can be obtained by taking advantage of LT-CSI at the transmitter.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (409 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved