Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Unsupervised learning of image manifolds by semidefinite programming
Weinberger, K.Q.   Saul, L.K.  
Dept. of Comput. & Inf. Sci., Pennsylvania Univ., Philadelphia, PA, USA;

This paper appears in: Computer Vision and Pattern Recognition, 2004. CVPR 2004. Proceedings of the 2004 IEEE Computer Society Conference on
Publication Date: 27 June-2 July 2004
Volume: 2,  On page(s): II-988- II-995 Vol.2
ISSN: 1063-6919
ISBN: 0-7695-2158-4
INSPEC Accession Number: 8169003
Digital Object Identifier: 10.1109/CVPR.2004.1315272
Current Version Published: 2004-07-19

Abstract
Can we detect low dimensional structure in high dimensional data sets of images and video? The problem of dimensionality reduction arises often in computer vision and pattern recognition. In this paper, we propose a new solution to this problem based on semidefinite programming. Our algorithm can be used to analyze high dimensional data that lies on or near a low dimensional manifold. It overcomes certain limitations of previous work in manifold learning, such as Isomap and locally linear embedding. We illustrate the algorithm on easily visualized examples of curves and surfaces, as well as on actual images of faces, handwritten digits, and solid objects.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (596 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved