Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Improving system dependability with functional alternatives
Shelton, C.P.   Koopman, P.  
Res. & Technol. Center, Robert Bosch Corp., Pittsburgh, PA, USA;

This paper appears in: Dependable Systems and Networks, 2004 International Conference on
Publication Date: 28 June-1 July 2004
On page(s): 295- 304
ISSN:
ISBN: 0-7695-2052-9
INSPEC Accession Number: 8205301
Digital Object Identifier: 10.1109/DSN.2004.1311899
Current Version Published: 2004-07-26

Abstract
We present the concept of alternative functionality for improving dependability in distributed embedded systems. Alternative functionality is a mechanism that complements traditional performability and graceful degradation techniques. Rather than providing reduced performance or functionality when components or subsystems fail, alternative functionality replaces a lost feature with another existing system junction that can substitute for the lost service. This can provide improved system dependability when it is not feasible to allocate dedicated backup systems for fault tolerance. We show how alternative functionality can be applied to enhance system dependability with a case study of an elevator control system. In simulation, an elevator design that implemented alternative functionality in some of its subsystems tolerated many combinations of component failures that caused system failures in the original design.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (323 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved